Magnetic

Probes with magnetic Co coating for magnetic measurements (MFM) in non-contact and tapping (intermittent contact/semi-contact) modes. To protect the Co coating from oxidation (for the purpose of prolongation cantilever performance) it can be formed as a cobalt film coated over by Cr film or as Co-Ni or Co-Cr alloy. In the latter two cases and of course in the case of pure Co the coating can also be protected by a thin (a few nm) dielectric film. Nevertheless the coating has a limited shelf life that depends mostly on humidity. However, there may be other reasons why probes loose sensitivity. Guaranteed shelf time is 3 months from the order receiving date. Resulting tip curvature radius is 40-90 nm and defined by uncoated tip radius (10-25 nm) and coating thickness (30-80 nm). The coating is uniform from the tip through the cantilever to the chip. If the coating is stress-free and does not lead to significant bending of the cantilever the coating is formed on the tip-side only and cantilever backside has high-reflective coating only, otherwise the coating is formed on both sides to prevent cantilever bending.

For detailed description of AIST-NT product codes please click here.