Gold (Au) coating

Probes with conductive Au tip-side coating for contact mode electrical measurements

Probes with conductive Au coating for contact mode electrical measurements. The coating is formed as a gold film on a chrome sublayer, which increases adhesion of gold to the silicon tip. The Au coating is chemically inert (very stable towards oxidation and has a long shelf time) and has low resistance (provides ohmic contact with samples). Resulting tip curvature radius is 50-70 nm and defined by uncoated tip radius (10-25 nm) and coating thickness (40-50 nm). The coating is uniform from the tip through the cantilever to the chip. If the coating is stress-free and does not lead to significant bending of the cantilever the coating is formed on the tip-side only and cantilever backside has high-reflective coating only, otherwise the coating is formed on both sides to prevent cantilever bending.

For detailed description of AIST-NT product codes please click here.

The cantilevers are not available until further notice.



Item Name Description- Qty. Starting Price Product Image

fpC10Au

Rectangular cantilever (250um, 20kHz, 0.1N/m).
Tip-side coating: Au.
10

... more info

fpC10Au

fpC11Au

2 rectangular cantilevers
(350..250um, 10..20kHz, 0.03..0.1N/m).
Tip-side coating: Au.
10

... more info

fpC11Au

fpC01Au

Rectangular cantilever (350um, 10kHz, 0.03N/m).
Tip-side coating: Au.
10

... more info

fpC01Au

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