Gold (Au) coating

Probes with conductive Au tip-side coating for non-contact and tapping mode electrical measurements

Probes with conductive Au coating for non-contact and tapping (intermittent contact/semi-contact) mode electrical measurements. The coating is formed as a gold film on a chrome sublayer, which increases adhesion of gold to the silicon tip. The Au coating is chemically inert (very stable towards oxidation and has a long shelf time) and has low resistance (provides ohmic contact with samples). Resulting tip curvature radius is 50-70 nm and defined by uncoated tip radius (10-25 nm) and coating thickness (40-50 nm). The coating is uniform from the tip through the cantilever to the chip. If the coating is stress-free and does not lead to significant bending of the cantilever the coating is formed on the tip-side only and cantilever backside has high-reflective coating only, otherwise the coating is formed on both sides to prevent cantilever bending.

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Item Name Description- Qty. Starting Price Product Image

fpN20Au

Triangular cantilever (90um, 420kHz, 50N/m).
Tip-side coating: Au.
10 $229.88

... more info

fpN20Au

fpN10Au

Rectangular cantilever (100um, 250kHz, 10N/m).
Tip-side coating: Au.
10 $229.88

... more info

fpN10Au

fpN11Au

2 rectangular cantilevers
(130..100um, 150..250kHz, 5..10N/m).
Tip-side coating: Au.
10 $229.88

... more info

fpN11Au

fpN01Au

Rectangular cantilever (130um, 150kHz, 5N/m).
Tip-side coating: Au.
10 $229.88

... more info

fpN01Au

fpN03Au

Rectangular cantilever (130um, 90kHz, 1N/m).
Tip-side coating: Au.
10 $229.88

... more info

fpN03Au

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